New D1 GIWAXS
procedure
Detlef Smilgies
mount sample
- go into hutch and move CCD camera back
- mount new sample
- put Idet
ion chamber in
- interlock hutch and open main shutter
align sample
- new data file > new
- put in new sample name
- OR hit return to continue with old name
- find sample height > rock
- reflectivity curve > xr
- determine absolute value of incident angle roughly from substrate critical angle on
print-out
- calibrate samth
> mv samth
[critical angle position]; set samth [critical angle value]
- make more detailed reflectivity scans, if desired
- for finetuning xrfine scan parameters, use > set_xrfine
take images
- enable CCD macros > ccdon
- go into hutch, remove Idet
ion chamber, and move CCD against clamp
- open main shutter, enable and open garage door on controller
- test image to verify correct beamstop position > corr
1 .1
- if CCD is overloaded, fix problem (if you think you can) or call Detlef !!!
- take images at various samth
and samx
positions using corr
and dark
- usage > corr
[mode] [exposure]
- without dezingering: mode=1
- with dezingering for exposures > 5 sec: mode = 2
- image averaging: 2 <= mode <= 10
- usage > dark
[exposure]
- dark images only need to be taken once a day; create new dark
image for new exposure time
- view list of previous dark images > ls dark
- take image of direct beam > beam
- disable CCD macros > ccdoff
additional macros (expert use only)
- open CCD shutter manually (make sure CCD is protected by closing the garage door !!!) > shopen
- close CCD shutter manually > shclose
- determine electronic offset of Idet for high-quality
reflectivity scans > offset
- the
offset count rate is saved in the log file as tseries scan
the following macros are used by rock, xr, and beam to control the
beamstop position
- move beamstop in > bsin
- move beamstop out > bsout
- move blade in for reflectivity > blade
- move attenuator in for beam image > attin